HiKM introduces its SEM product lineup around BSR-1000, BSR-2000, and SEM-REELS for semiconductor inspection and backside review.
BSR-1000 connects backside defect review, SEM imaging, EDS analysis, reporting, and process feedback while preserving the wafer.
BSR-2000 and SEM-REELS remain roadmap products, with development direction and review scope shared within the public disclosure range.
Key points
- BSR-1000: consultable Backside Review SEM
- BSR-2000: next-generation In-Line SEM roadmap
- SEM-REELS: SEM extension analysis technology based on KRISS collaboration
For related inquiries, please connect through product inquiry or technical consultation.
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