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Next-generation In-Line SEM

BSR-2000

BSR-2000 is a next-generation platform for 300mm Wafer Backside Review, integrating high-resolution imaging, damage-free wafer handling, flip system, vacuum stage, AI-based image quality enhancement, and ADC functions.

BSR-2000 product image
BSR-2000 Product Image

Target Technology

BSR-2000 Development Focus

300mmWafer Backside

Targets advancement of a 300mm Wafer Backside Review SEM platform.

In-LineFab Integration

Reviews linkage with process automation and in-line review workflows.

Flip SystemFront / Back Handling

Includes wafer front/backside damage-free handling and flip system in the development direction.

AIImage Quality / ADC

Reviews AI-based image quality enhancement and automatic defect classification.

VacuumParticle Control

Aims for stable operation based on load lock, vacuum stage, and particle control.

HBM4 / HBFAdvanced Process

Reviews applicability to next-generation high-value semiconductor processes.

Development Items

Development and Application Direction

High-resolution Imaging

Reviews beam stabilization and high-resolution imaging including column, back-bias/retarding voltage, and discharge response technology.

Damage Free Handling

Reviews wafer damage-minimization structure around front/backside handling, holder, stage, and flip system.

Particle Free Vacuum System

Develops toward reduced contamination and particle influence including load lock chamber, vacuum stage, gate valve, and pumping structure.

Software & Factory Automation

Includes integrated GUI, ADR/ADC, AI image quality enhancement, result report, and factory automation linkage.

BSR-2000 is a roadmap product under development. Detailed specifications, release timing, and public performance figures will be updated at official disclosure stages.

Product Inquiry

BSR-2000 Technical Meeting and Roadmap Consultation

Share your process conditions, automation scope, and wafer handling requirements so we can review the BSR-2000 roadmap and application possibilities.